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card_3245.txt
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1991-02-03
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727b
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33 lines
-- card: 3245 from stack: in
-- bmap block id: 0
-- flags: 0000
-- background id: 2674
-- name:
-- part contents for background part 3
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4
-- part contents for background part 4
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SiGe devices / BJT / HBT
-- part contents for background part 6
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Numerical simulation and comparison of Si BJT's and Si(1-x)Ge(x) HBT's.
-- part contents for background part 7
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B. Pejcinovic / L.E. Kay / T.W Tang / D.H. Navon
-- part contents for background part 9
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IEEE Trans. Electron Devices, 36, 2129, 1989
-- part contents for background part 17
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Low field carrier mobilities measured. Stained layer mobilities higher than unstrained.